There is presently a strong interest for rigorous methods that perform the electromagnetic analysis of dielectric media with complex dielectric permittivity distribution. The interest is motivated by both present and future applications in the design and manufacturing of optical elements and optoelectronic devices. The level that the microstructuring technologies have now reached calls for fast, memory sparing, and rigorous numerical methods capable of solving and optimizing large structure parts whose characteristics do represent the optical function of the whole structure. Although the majority of modeling problems in microoptics are non-periodic (e.g., a section of an OLED extraction layer, the cell of a microelectronic reticle, a high NA diffractive microlens) they can be efficiently solved by periodizing the index distribution. A new powerful numerical method for the exact modeling of 2D periodic structures is described with all features and expressions needed to implement it. The power of this method is in its unique specific form which permits to apply fast numerical algorithms and, consequently, to decrease dramatically the calculation complexity in comparison with established methods. The comparison with reference solutions has shown that, first, the new method gives the same results as the latter on benchmark structures and, secondly, that the needed calculation time and memory resort represent a breakthrough towards solving larger periodic or periodized structures. The developed method was applied to analyze nonperiodic scattering problem of a plane dielectric layer with spherical micro/nanoparticles. Proposed numerical benchmark demonstrated the possibility to get about 1% accuracy. In addition there was developed a numerical S-matrix based method for planar electroluminescent structures simulation. Validity of the method was demonstrated by comparison with experimental results. Finally both methods for the light scattering calculation and multilayer structures simulation were joined, and a scattering layer was demonstrated to increase an OLED external efficiency by several percent
| Identifer | oai:union.ndltd.org:CCSD/oai:tel.archives-ouvertes.fr:tel-00981512 |
| Date | 29 June 2012 |
| Creators | Shcherbakov, Alexey |
| Publisher | Université Jean Monnet - Saint-Etienne |
| Source Sets | CCSD theses-EN-ligne, France |
| Language | English |
| Detected Language | English |
| Type | PhD thesis |
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