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Non-destructive depth profiling using electron beam techniques

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.367468

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:367468
Date	January 2000
Creators	Loveday, Daniel A.
Publisher	University of York
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation