Charge defects in low temperature silicon nitride/silicon interfaces for applications in computational clothing and electronic textiles

Description

Thesis (M.S.)--North Carolina State University. / Includes vita. Includes bibliographical references (p. 41-45).

Links & Downloads

1. http://www.lib.ncsu.edu/theses/available/etd-07222002-121040/unrestricted/etd.pdf

Tags

North Carolina State University

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/50274662
Date	January 2002
Creators	Park, Kie Jin,
Source Sets	OCLC
Language	English
Detected Language	English