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Statistical Design For Yield And Variability Optimization Of Analog Integrated Circuits

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Identiferoai:union.ndltd.org:IISc/oai:etd.ncsi.iisc.ernet.in:2005/1198
Date12 1900
CreatorsNalluri, Suresh Babu
ContributorsShiva Prasad, A P
Source SetsIndia Institute of Science
Languageen_US
Detected LanguageEnglish
TypeThesis
RelationG18903

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