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Uniform and localized charge-trapping in SONOS nonvolatile memory devices /

Thesis (Ph. D.)--Lehigh University, 2005. / Includes vita. Includes bibliographical references (leaves 158-174).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/62508970
Date January 2005
CreatorsWang, Yu,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeAcademic dissertations

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