Endurance characterization and improvement of floating gate semiconductor memory devices

Description

Thesis (M.S.)--Rutgers University, 2009. / "Graduate Program in Electrical and Computer Engineering." Includes bibliographical references (p. 113-116).

Links & Downloads

1. http://hdl.rutgers.edu/1782.2/rucore10001600001.ETD.000051734

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/551425123
Date	January 2009
Creators	Khan, Faraz I.
Source Sets	OCLC
Language	English
Detected Language	English