Measurement of lattice strain and relaxation effects in strained silicon using x-ray diffraction and convergent beam electron diffraction

Description

Thesis (Ph. D.)--University of North Texas, Aug., 2007. / Title from title page display. Includes bibliographical references.

Links & Downloads

1. http://digital.library.unt.edu/permalink/meta-dc-3978

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/191849891
Date	January 2007
Creators	Diercks, David Robert. Kaufman, Michael Joseph,
Publisher	[Denton, Tex.] : University of North Texas,
Source Sets	OCLC
Language	English
Detected Language	English
Source	connect to online resource.