Investigation of surface states and device surface charging in nitride materials using scanning Kelvin probe microscopy

Description

Thesis (Ph.D.) -- Virginia Commonwealth University, 2005. / Title from title-page of electronic thesis. Prepared for: Dept. of Electrical Engineering. Bibliography: p. 93-97.

Links & Downloads

1. http://hdl.handle.net/10156/1436

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/70205079
Date	January 1900
Creators	Sabuktagin, Mohammed Shahriar
Publisher	[Richmond, Va : Virginia Commonwealth University,
Source Sets	OCLC
Language	English
Detected Language	English