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A remotely controlled power quality test platform for characterizing the ride-through capabilities of adjustable speed drives

With the increased attention on high efficiency and controllability of industrial processes, as
well as reduced weight, volume and cost of consumer products, the applications of nonlinear
power electronic converters such as adjustable speed drives (ASDs) are showing a rapid rise.
Power Quality (PQ) is becoming an increasing concern with the growth of both sensitive and
disturbing nonlinear loads in the residential, commercial and industrial levels of the power
system, where PQ related disruptions can cause system malfunction, product loss, and hardware
damage resulting in costly data loss and downtime. Investigating and mitigating PQ issues
pertaining to the input supply of ASDs and other sensitive power electronic equipment is
extremely important in maintaining a high level of productivity.
In response to these concerns, this research focuses on the development of a power quality
test platform (PQTP) that has been implemented at Oregon State University (OSU), in the Motor
Systems Resource Facility (MSRF). The central component of the PQTP is a 120kVA
programmable ac power source with an integrated arbitrary waveform generator (AWG) which
creates realistic voltage disturbance conditions that can be used to characterize ride-through
capabilities of industrial processes in a controlled environment. Also presented is a command
driver database that has been created and tested, using Lab VIEW, which contains the
functionality necessary to conduct a wide range of power quality research and testing projects by
remotely configuring and controlling the AWG.
The power quality research and testing capabilities of the PQTP are demonstrated with ASD
diode-bridge rectifier operation analysis and ride-through characterization. This research shows
the transition of an ASD's three-phase diode rectifier into single-phase diode rectifier operation
when relatively small single-phase voltage sags are applied to the input. Also shown are ride-through
characterizations of varying sizes and configurations of ASDs when subjected to single,
two, and three-phase voltage sags as well as capacitor switching transients. In addition, ASD
topologies providing improved ride-through capabilities are determined. / Graduation date: 2002

Identiferoai:union.ndltd.org:ORGSU/oai:ir.library.oregonstate.edu:1957/32614
Date08 June 2001
CreatorsMatheson, Evelyn
Contributorsvon Jouanne, Annette R.
Source SetsOregon State University
Languageen_US
Detected LanguageEnglish
TypeThesis/Dissertation

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