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Computer simulation of SiO←x structure based on thin film Si 2p peaks of X-ray photoelectron spectroscopy

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.315427

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:315427
Date	January 1992
Creators	Sahota, Makhan Singh
Publisher	Brunel University
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation