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SOFT X-RAY FORMATION MEASUREMENT OF LOW DENSITY MATERIALS AND COMPRESSIVE RESPONSE CHARACTERIZATION

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:miami1350679879
Date29 October 2012
CreatorsFeng, Chi
PublisherMiami University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageUnknown
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=miami1350679879
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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