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Emotional responses to technology failure looking beyond the appraisal of subjective importance /

Thesis (Ph. D.)--Ohio State University, 2008. / Title from first page of PDF file. Includes bibliographical references (p. 114-122).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/227800011
Date January 2008
CreatorsStraub, Evan T.,
PublisherColumbus, Ohio : Ohio State University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to resource online

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