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Characterisation of ionisation induced surface effects for the optimisation of silicon detectors for particle physics applications

Dortmund, Univ., Diss., 2001. / Computerdatei im Fernzugriff.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/638342516
Date January 2001
CreatorsWüstenfeld, Jens.
Publisher[S.l.] : [s.n.],
Source SetsOCLC
LanguageUndetermined
Detected LanguageEnglish

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