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Characterization of Pt-H related defects in Si and intrinsic defects in ZnTe via optical and magnetic resonance methods /

Thesis (Ph. D.)--Lehigh University, 1998. / Includes vita. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/40278590
Date January 1998
CreatorsUftring, Stephen John,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeAcademic dissertations

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