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Independence fault collapsing and concurrent test generation

Thesis(M.S.)--Auburn University, 2006. / Abstract. Vita. Includes bibliographic references (p.74-78).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/244014447
Date January 2006
CreatorsDoshi, Alok Shreekant. Agrawal, Vishwani D.,
PublisherAuburn, Ala. ,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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