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Electron diffraction analysis of amorphous Ge2Sb2Te5

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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:669987
Date January 2010
CreatorsChen, Yixin
ContributorsCockayne, D. J. H.
PublisherUniversity of Oxford
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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