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On-chip testing of very large scale integrated circuits

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.352018

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:352018
Date	January 1984
Creators	Varma, P.
Publisher	University of Manchester
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation