Modeling of FETs with abnormal gate geometries for radiation hardening

Description

Thesis (M.S. in Electrical Engineering)--Washington State University. / Includes bibliographical references.

Links & Downloads

1. http://www.dissertations.wsu.edu/Thesis/Summer2004/c%5Fchampion%5F072204.pdf

Tags

Field-effect transistors

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/56429426
Date	January 2004
Creators	Champion, Corbin Leigh,
Source Sets	OCLC
Language	English
Detected Language	English
Source	Online access for everyone