Prediction of mean time between failures of electronic subsystems from component failure rates determined under varying environmental conditions

Description

Call number: LD2668 .R4 1965 H589

Links & Downloads

1. http://hdl.handle.net/2097/23509

Tags

Masters theses

Additional Fields

Identifer	oai:union.ndltd.org:KSU/oai:krex.k-state.edu:2097/23509
Date	January 1965
Creators	Hetland, Joel S.
Source Sets	K-State Research Exchange
Detected Language	English
Type	Text