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Rapid Thickness Measurement of Free-standing Smectic Films

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:kent1657928707763577
Date21 July 2022
CreatorsChen, Wei
PublisherKent State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=kent1657928707763577
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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