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The characterisation of defects in III-V semiconducting compounds by electron microscopy

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.279689

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:279689
Date	January 1990
Creators	Dixon, Richard H.
Publisher	University of Surrey
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation