Chan, Wing Chit = (La₀.₆₇Ca₀.₃₃MnO₃/La₀.₃₀Ca₀.₇₀MnO₃/La₀.₆₇Sr₀.₃₃MnO₃/La₀.₃₀Ca₀.₇₀MnO₃)多層薄膜的電子輸運特性 / 陳榮捷. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2009. / Includes bibliographical references. / Abstract also in Chinese. / Chan, Wing Chit = (La₀.₆₇Ca₀.₃₃MnO₃/La₀.₃₀Ca₀.₇₀MnO₃/La₀.₆₇Sr₀.₃₃MnO₃/La₀.₃₀Ca₀.₇₀MnO₃) duo ceng bo mo de dian zi shu yun te xing / Chen Rongjie. / Abstract --- p.i / 論文摘要 --- p.iii / Acknowledgements --- p.iv / Table of Contents --- p.v / List of Figures --- p.viii / List of Tables --- p.xiii / Chapter Chapter 1 --- Introduction / Chapter 1.1 --- Review of Magnetoresistance --- p.1 / Chapter 1.1.1 --- Giant magnetoresistance (GMR) --- p.4 / Chapter 1.1.2 --- Colossal magnetoresistance (CMR) --- p.7 / Chapter 1.2 --- Possible origins of CMR in manganites --- p.10 / Chapter 1.2.1 --- Double exchange mechanism --- p.10 / Chapter 1.2.2 --- Tolerance factor --- p.14 / Chapter 1.2.3 --- Jahn-Teller Distortion --- p.16 / Chapter 1.2.4 --- Magnetic phase diagram and charge ordering (CO) --- p.19 / Chapter 1.2.5 --- Phase separation and percolation theory --- p.23 / Chapter 1.2.6 --- Phase separation at the interfaces in thin films --- p.28 / Chapter 1.3 --- Our motivation --- p.29 / Chapter 1.4 --- Literature review of some manganite multilayer systems --- p.31 / Chapter 1.4.1 --- Ferromagnetic (FM)/antiferromagnetic (AF) multilayers --- p.31 / Chapter 1.4.2 --- Ferromagnetic (FM)/insulating oxides multilayers --- p.32 / Chapter 1.4.3 --- Ferromagnetic (FM)/ferromagnetic (FM) multilayers --- p.33 / Chapter 1.5 --- Scope of this thesis --- p.34 / References --- p.36 / Chapter Chapter 2 --- Instrumentation / Chapter 2.1 --- Thin film deposition --- p.40 / Chapter 2.1.1 --- Facing-target sputtering --- p.41 / Chapter 2.1.2 --- Vacuum system --- p.44 / Chapter 2.2 --- Characterization --- p.46 / Chapter 2.2.1 --- α-step profilometer --- p.46 / Chapter 2.2.2 --- x-ray diffraction (XRD) --- p.46 / Chapter 2.2.3 --- Resistance measurement --- p.49 / References --- p.51 / Chapter Chapter 3 --- Epitaxial growth and characterization of single layer thin films / Chapter 3.1 --- Introduction --- p.52 / Chapter 3.2 --- Fabrication of the sputtering targets --- p.52 / Chapter 3.3 --- Epitaxial growth of single layer thin films --- p.53 / Chapter 3.3.1 --- Substrate materials --- p.54 / Chapter 3.3.2 --- Deposition conditions --- p.55 / Chapter 3.3.3 --- Deposition procedures --- p.57 / Chapter 3.3 --- Characterization of single layer thin films --- p.58 / References --- p.63 / Chapter Chapter 4 --- La0 67Ca0.33MnO3/La030Ca0.70MnO3/La067Sr0.33MnO3/La0.30Ca070MnO3 multilayers / Chapter 4.1 --- Sample preparation --- p.64 / Chapter 4.2 --- Structure characterization of as-deposited samples --- p.68 / Chapter 4.3 --- Transport properties of as-deposited samples --- p.79 / Chapter 4.3.1 --- Series of samples with fixed Lao.3oCao.7oMn03 barrier layer thickness --- p.79 / Chapter 4.3.3.1 --- Samples with thin ferromagnetic layers: C20 and S20 series --- p.82 / Chapter 4.3.1.2 --- Series of samples with thick ferromagnetic layers --- p.87 / Chapter 4.3.1.3 --- Parallel resistors network --- p.96 / Chapter 4.3.2 --- Series of samples with varying Lao.3oCao.7oMn03 barrier layer thickness --- p.101 / Chapter 4.4 --- Discussion --- p.108 / References --- p.114 / Chapter Chapter 5 --- Conclusion / Chapter 5.1 --- Conclusion --- p.116 / Chapter 5.2 --- Future outlook --- p.119 / References --- p.121
| Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_326893 |
| Date | January 2009 |
| Contributors | Chan, Wing Chit., Chinese University of Hong Kong Graduate School. Division of Physics. |
| Source Sets | The Chinese University of Hong Kong |
| Language | English, Chinese |
| Detected Language | English |
| Type | Text, bibliography |
| Format | print, xiii, 121 leaves : ill. ; 30 cm. |
| Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
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