by Lai Yiu Wai. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2005. / Includes bibliographical references. / Abstract in English and Chinese. / Abstract / Abstract (Chinese) / Table of Contents / List of Figures / List of Tables / Chapter Chapter 1 --- Introduction / Chapter 1.1 --- Overview --- p.1-1 / Chapter 1.2 --- Conventional recording --- p.1-2 / Chapter 1.3 --- Superparamagnetism --- p.1-2 / Chapter 1.4 --- Possible solutions --- p.1-4 / Chapter 1.4.1 --- Perpendicular recording --- p.1-5 / Chapter 1.4.2 --- Patterned media --- p.1-6 / Chapter 1.4.3 --- High Ku material for recording media --- p.1-7 / Chapter 1.5 --- FePt-based material research 1 - --- p.1-8 / Chapter 1.6 --- Project goal --- p.1-11 / Reference --- p.1-12 / Chapter Chapter 2 --- Sample preparation and characterization techniques / Chapter 2.1 --- Pulsed filtered vacuum arc deposition (PFVAD) --- p.2-1 / Chapter 2.1.1 --- Sample preparation --- p.2-4 / Chapter 2.2 --- Rutherford backscattering spectroscopy (RBS) --- p.2-4 / Chapter 2.3 --- X-ray diffraction (XRD) --- p.2-6 / Chapter 2.4 --- Vibrating sample magnetometery (VSM) --- p.2-7 / Chapter 2.5 --- Transmission electron microscopy (TEM) --- p.2-9 / Reference --- p.2-10 / Chapter Chapter 3 --- Characterization of FePt-C nanocomposite thin film / Chapter 3.1 --- Experiment design --- p.3-1 / Chapter 3.2 --- Experiment detail --- p.3-1 / Chapter 3.3 --- Results and discussion --- p.3-3 / Chapter 3.3.1 --- NRBS measurements --- p.3-3 / Chapter 3.3.2 --- XRD measurements --- p.3-8 / Chapter 3.3.3 --- VSM measurements --- p.3-14 / Chapter 3.3.4 --- Some preliminary results on effects of post- deposition implantation --- p.3-23 / Chapter 3.3.5 --- TEM images --- p.3-26 / Chapter 3.3.6 --- Overall discussion --- p.3-29 / Chapter 3.3.6.1 --- Total film thickness effect --- p.3-29 / Chapter 3.3.6.2 --- Degree of ordering from XRD (001)/(002) peak intensity ratio --- p.3-33 / Chapter 3.3.6.3 --- C spacer thickness effect --- p.3-34 / Chapter 3.3.6.4 --- Implantation effect --- p.3-35 / Chapter 3.4 --- Summary --- p.3-35 / Reference --- p.3-36 / Chapter Chapter 4 --- Characterization of FePt-Cu nanocomposite thin film / Chapter 4.1 --- Experiment design --- p.4-1 / Chapter 4.2 --- Experiment detail --- p.4-1 / Chapter 4.3 --- Results and discussion --- p.4-3 / Chapter 4.3.1 --- RBS measurements --- p.4-3 / Chapter 4.3.2 --- XRD measurements --- p.4-7 / Chapter 4.3.3 --- VSM measurements --- p.4-9 / Chapter 4.3.4 --- Discussion --- p.4-12 / Chapter 4.3.4.1 --- Total film thickness effect --- p.4-12 / Chapter 4.3.4.2 --- Cu spacer thickness effect --- p.4-13 / Chapter 4.4 --- FePt films without additive --- p.4-16 / Chapter 4.5 --- Summary --- p.4-17 / Reference --- p.4-18 / Chapter Chapter 5 --- Conclusion and future works / Chapter 5.1 --- Conclusion --- p.5-1 / Chapter 5.2 --- Future works --- p.5-3 / Reference --- p.5-4 / Appendix 1 / Appendix 2
| Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_325148 |
| Date | January 2005 |
| Contributors | Lai, Yiu Wai., Chinese University of Hong Kong Graduate School. Division of Electronic Engineering. |
| Source Sets | The Chinese University of Hong Kong |
| Language | English, Chinese |
| Detected Language | English |
| Type | Text, bibliography |
| Format | print, 1 v. (various pagings) : ill. (some col.) ; 30 cm. |
| Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
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