Characterization of metal-ferroelectric-insulator-semiconductor structures based on ferroelectric Langmuir-Blodgett polyvinylidene fluoride copolymer films for nondestructive random access memory applications

Description

Thesis (Ph.D.)--University of Nebraska-Lincoln, 2007. / Title from title screen (site viewed June 17, 2008). PDF text: vi, 94 p. : ill. (some col.) ; 3 Mb. UMI publication number: AAT 3293918. Includes bibliographical references. Also available in microfilm and microfiche formats.

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Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/233639899
Date	January 1900
Creators	Reece, Timothy James.
Publisher	[Lincoln, Neb. : University of Nebraska-Lincoln,
Source Sets	OCLC
Language	English
Detected Language	English