An automated ellipsometer was used to study field-induced optical anisotropy in anodic niobium oxide films. The oxide films were found to change from the optically isotropic state to the optically anisotropic state when an electric field was applied normal to the film surface. The anisotropic refractive indices of the oxide films decreased quadratically while the thickness of the films increased quadratically with the applied field. The quadratic electro-optic coefficients were determined. The changes in refractive indices and in thickness of the oxide films were found to be independent of time.
Field recrystallization of the anodic niobium oxide films was investigated using a scanning electron microscope. The results are compared with those reported for anodic tantalum oxide films in the published literature. / Applied Science, Faculty of / Electrical and Computer Engineering, Department of / Graduate
| Identifer | oai:union.ndltd.org:UBC/oai:circle.library.ubc.ca:2429/19332 |
| Date | January 1974 |
| Creators | Yee, Kai Kwan |
| Source Sets | University of British Columbia |
| Language | English |
| Detected Language | English |
| Type | Text, Thesis/Dissertation |
| Rights | For non-commercial purposes only, such as research, private study and education. Additional conditions apply, see Terms of Use https://open.library.ubc.ca/terms_of_use. |
Page generated in 0.0017 seconds