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Measurement of the Young's modulus of hexoloy silicon carbide thin films using nanoindentation

Thesis (M.Eng.). / Written for the Dept. of Mechanical Engineering. Title from title page of PDF (viewed 2008/01/14). Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/316024640
Date January 1900
CreatorsCrocker, Janina.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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