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Magneto-crystalline anisotropy calculation in thin films with defects

The code is developed for the calculation of the magneto-crystalline anisotropy
(MAE) in thin films using a classical Heisenberg hamiltonian with a correction
developed by Van Vleck. A Metropolis style Monte Carlo algorithm was used
with adequate corrections to accelerate the calculation. The MAE was calculated
for the case of a thin film with an increasing number of defects on the top layer for
the cases where the defects were distributed randomly and when they assumed ordered
positions. The results obtained agree qualitatively with the results provided
by the literature and with the theory. / Graduation date: 2003

Identiferoai:union.ndltd.org:ORGSU/oai:ir.library.oregonstate.edu:1957/31144
Date05 November 2002
CreatorsMatusevich, David Sergio
ContributorsJansen, Henri J. F.
Source SetsOregon State University
Languageen_US
Detected LanguageEnglish
TypeThesis/Dissertation

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