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Effect of interstitial impurities on the residual resistivity of Niobium thin films /

Thesis (Honors)--College of William and Mary, 2008. / Includes bibliographical references (leaves 61-62). Also available via the World Wide Web.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/303579237
Date January 2008
CreatorsConnell, Justin.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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