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Analysis of metal oxide thin film transistors with high-k dielectrics and source/drain contact metals

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.648586

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:648586
Date	January 2014
Creators	Kiani, Ahmed
Publisher	University of Cambridge
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation