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Analysis of Proximitized Molybdenum-Copper Superconducting Bilayers

abstract: A series of Molybdenum-Copper bilayers were studied for use in 120mK superconducting transition edge sensors for spectrometer applications. The Transition temperature (T<sub>C</sub>) was tuned to the desired temperature using the proximity effect, by adjusting the thickness of a normal copper layer in direct contact with the superconducting molybdenum layer in a proximitized bilayer structure. The bilayers have a fixed normal metal thickness d<sub>Cu</sub>=1250 &Aring;, on top of a variable superconductor thickness 650 &Aring; &le; d<sub>Mo</sub> &le; 1000 &Aring;. Material characterization techniques including X-ray Diffraction (XRD), Rutherford Backscattering Spectroscopy (RBS), Atomic Force Microscopy (AFM), and 4-point electrical characterization are used to characterize the films. Film TC are compared with the results of the Usadel proximity theory. The results of RBS analysis demonstrated that some Argon-contamination is observed at the Mo film-substrate interface, which correlates with bilayer surface roughness (as observed with AFM), reduced crystalline quality (via XRD Rocking Curve), and a deviation from the theoretical expected TC for a bilayer. The Argon contamination is presumably the cause of interface roughness, reducing the interface transmission coefficient in the Usadel model, and producing the discrepancy from the expected TC. / Dissertation/Thesis / Masters Thesis Materials Science and Engineering 2014

Identiferoai:union.ndltd.org:asu.edu/item:25826
Date January 2014
ContributorsKopas, Cameron J (Author), Newman, Nathan (Advisor), Singh, Rakesh (Committee member), Chamberlin, Ralph (Committee member), Arizona State University (Publisher)
Source SetsArizona State University
LanguageEnglish
Detected LanguageEnglish
TypeMasters Thesis
Format38 pages
Rightshttp://rightsstatements.org/vocab/InC/1.0/, All Rights Reserved

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