This diploma thesis deals with the structural analysis of semiconductor nanowires by transmission electron microscopy. The construction of microscope is introduced together with its basic imaging modes and with the function of each construction element in these modes. In the experimental part the results of analysis of several germnaium nanowires are discussed, with emphasis on their crystallographic structure and orientation.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:241698 |
| Date | January 2016 |
| Creators | Kachtík, Lukáš |
| Contributors | Sháněl, Ondřej, Kolíbal, Miroslav |
| Publisher | Vysoké učení technické v Brně. Fakulta strojního inženýrství |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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