Return to search

TEM studies of defects in GaInAs and GaInP epitaxial layers

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:670418
Date January 1983
CreatorsHockley, Mark
ContributorsBooker, G. R.
PublisherUniversity of Oxford
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

Page generated in 0.0017 seconds