The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects

Description

Thesis (Ph. D.)--University of Florida, 1981. / Description based on print version record. Typescript. Vita. Includes bibliographical references (leaves 220-224).

Links & Downloads

1. http://www.archive.org/details/sensitivityoftwo00syke

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/648255936
Date	January 1981
Creators	Sykes, Lawrence Joseph,
Publisher	Gainesville, FL,
Source Sets	OCLC
Language	English
Detected Language	English