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A study of the ZrO2/NiO interfaces

The stable interfaces between NiO and ZrO2 reached by nanofilms interface rotation method are reported in this study. Epitaxial nanofilms of NiO and ZrO2 were synthesized on single crystal NaCl (001), (011), (111) surfaces. All nanofilms are investigated by transmission electron microscopy and selected-area diffraction (SAD) patterns. Composite nanofilms were formed by overlapping nanofilms of NiO and ZrO2 at difference angles and thermally treated. The rotation process and final stable interfaces in the overlapped nanofilms are analyzed by SAD patterns. Orientation relationships and interface rotation are analyzed. This study found five new interfaces.
(1) (001)N/ Z¡A[110]N//[110]Z
(2) (001)N/ Z¡A[100]N//[110]Z
(3) N/ Z¡A[110]N//[110]Z
(4) N/ Z¡A[111]N//[110]Z
(5) N/ Z¡A[001]N//[110]Z

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0824111-033939
Date24 August 2011
CreatorsChen, Jiun-Yang
ContributorsLiu-Wen Chang, Der-Shin Gan, Pou-Yan Shen
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0824111-033939
Rightsunrestricted, Copyright information available at source archive

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