The effect of ultrasonic vibration on the anodic oxidation of silver foil in KOH was studied. An increase in charging capacity of approximately 20% was found to be the result of cavitation erosion. Silver wire was exposed to tension and torsion during oxidation but no change in charge acceptance was caused by these stresses. The oxide growth rate on silver foil electrodes was compared to rate equations that have been proposed for other metals. Uhlig's equations for the growth of semiconductor oxides was found to describe most of the data. The data did not fit other rate equations. Determination of the location of radioactive Ag110 in the oxide layer indicated that silver oxide grows by direct transport of the silver ion through the oxide, if a uniform oxide thickness is assumed. However, the dissolution-precipitation-model of oxide growth describes the data better and allows for the non-uniform oxide thickness which is characteristic of silver.
| Identifer | oai:union.ndltd.org:BGMYU2/oai:scholarsarchive.byu.edu:etd-9186 |
| Date | 01 December 1976 |
| Creators | Chase, Reed Harold |
| Publisher | BYU ScholarsArchive |
| Source Sets | Brigham Young University |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Theses and Dissertations |
| Rights | http://lib.byu.edu/about/copyright/ |
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