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Integration and data acquisition of an optical spectroscopy and optical transmission properties of bulk GaNP material

Our major work is to use LabVIEW as the platform to develop the instrument control programs for measuring the optical and electrical properties of semiconductor materials.
To measure the optical properties of semiconductor materials, we developed an optical spectroscopy control program. The program can be modified to make it suitable for many kinds of optical spectroscopy systems. Here we use it to measure the transmission spectrum of GaNP bulk material.
To measure the electrical properties of semiconductor materials, we developed a program to record the I-V characteristic curve of the device under test. We can use it to check the ohmic property of contact form between metal electrode and semiconductor material. Finally, we developed a program to record the photoconductivity build-up and decay transient curve.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0909107-072456
Date09 September 2007
CreatorsLai, Chun-chen
ContributorsWei-hung Su, Chao-yi Tai, Da-ren Hang
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0909107-072456
Rightsunrestricted, Copyright information available at source archive

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