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Optimization of etching parameters for STM tips and an STM study of SiC (0001) [square root]3 x [square root]3 reconstruction /

Thesis (M. Phil.)--University of Hong Kong, 1999. / Includes bibliographical references (leaves 100-101).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/51346895
Date January 1998
CreatorsNg, Yee-fai.
PublisherHong Kong : University of Hong Kong,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceView the Table of Contents & Abstract.

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