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Growth and characterization of thin Al2O3 and Ga2O3 films on single-crystalline Ni, Co, and CoGa substrates

Düsseldorf, Univ., Diss., 2004. / Computerdatei im Fernzugriff.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/637387830
Date January 2004
CreatorsWehner, Arno.
Publisher[S.l.] : [s.n.],
Source SetsOCLC
LanguageUndetermined
Detected LanguageEnglish

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