Dielectric waveguides are becoming important for their numerous
applications in integrated optics. The study of dielectric waveguides by analytical
techniques is not sufficient for many variations in waveguide shape, anisotropy,
and inhomogeneity commonly encountered in waveguide materials. This work
studies the finite element method as an accurate tool for the numerical modeling of
dielectric waveguides. Other commonly used numerical techniques are also
considered. The implementation of the finite element method is discussed. The
finite element technique is also modified to incorporate the lack of fixed-potential
boundary conditions in dielectric waveguides. The results of the simulations are
documented for several experimental and analytical test cases.
Measurements were made on waveguides fabricated in-house using the
plasma-enhanced chemical vapor deposition (PECVD) films of silicon oxynitride.
The light source was a 6328 A helium-neon laser. The results of the finite element
simulations are compared with the experimental results and with other previously
documented numerical and analytical results from the literature. The finite
element method developed here is shown to be in good agreement with these
results and will be useful in solving for the modes of novel waveguide designs. / Graduation date: 1993
| Identifer | oai:union.ndltd.org:ORGSU/oai:ir.library.oregonstate.edu:1957/36525 |
| Date | 01 April 1993 |
| Creators | Vishakhadatta, Gannavaram D. |
| Contributors | Plant, Thomas K. |
| Source Sets | Oregon State University |
| Language | en_US |
| Detected Language | English |
| Type | Thesis/Dissertation |
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