Return to search

Characterization of the strength, stiffness, and ductility behavior of T-stub connections

No description available.
Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/24166
Date08 1900
CreatorsSwanson, James A.
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageEnglish
TypeDissertation
RightsAccess restricted to authorized Georgia Tech users only.

Page generated in 0.0102 seconds