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Atomic Scale Characterization of Point Defects in the Ultra-Wide Band Gap Semiconductor β-Ga2O3

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1577916628182296
Date January 2020
CreatorsJohnson, Jared M.
PublisherThe Ohio State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=osu1577916628182296
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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