As the critical dimensions of many devices, especially electronics, continue to become smaller, the ability to accurately analyze the properties at ever smaller scales
becomes necessary. Optical techniques, such as confocal microscopy and various
spectroscopies, have produced a wealth of information on larger length scales, above the
diffraction limit. Scanning probe techniques, such as scanning tunneling microscopy and atomic force microscopy, provide information with an extremely fine resolution, often on the order of nanometers or angstroms. In this document, plasmon coupling is used to generate large signal increases, with clear future applications toward scanning probe optical spectroscopies. A variation on scanning tunneling microscopy is also used to study the surface structure of environmentally interesting nanoparticles. Traditional Raman spectroscopy is used to examine doped graphene, which is becoming a hot material for future electronic applications.
| Identifer | oai:union.ndltd.org:RICE/oai:scholarship.rice.edu:1911/71934 |
| Date | 16 September 2013 |
| Creators | Chang, Albert |
| Contributors | Kelly, Kevin |
| Source Sets | Rice University |
| Language | English |
| Detected Language | English |
| Type | thesis, text |
| Format | application/pdf |
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