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A precision determination of the K x-ray fluorescence yield of arsenic from the radioactive decay of solid se[superscript]75 sources

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1. 326987
2. http://hdl.handle.net/1853/27543

Identifer	oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/27543
Date	05 1900
Creators	Chew, William Mahlon
Publisher	Georgia Institute of Technology
Source Sets	Georgia Tech Electronic Thesis and Dissertation Archive
Detected Language	English
Type	Thesis
Rights	Access restricted to authorized Georgia Tech users only.