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Surface parameter estimation using bistatic polarimetric X-band measurements

Techn. Univ., Diss., 2008--Chemnitz.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/611787205
Date January 2008
CreatorsKhadhra, Kais Ben.
PublisherKöln DLR
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceInhaltsverzeichnis

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