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Phase retrieval using two fourier transform intensities with application to X-ray crystalography

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1. http://hdl.handle.net/1853/15022
2. 348018

Identifer	oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/15022
Date	08 1900
Creators	Kim, Wooshik
Publisher	Georgia Institute of Technology
Source Sets	Georgia Tech Electronic Thesis and Dissertation Archive
Detected Language	English
Type	Dissertation
Rights	Access restricted to authorized Georgia Tech users only.