An X-ray diffraction method has been developed which was able to describe the diffusion zone produced by annealing nickel plated copper specimens at 750 degrees and 850 degrees. The experimental X-ray diffraction data were first corrected for instrumental broadening and then used to compute concentration-penetration curves across the diffusion zone. the experimental curves are in general agreement with a new mathematical analysis and also the diffusion coefficients reported in the literature. / Master of Science
| Identifer | oai:union.ndltd.org:VTETD/oai:vtechworks.lib.vt.edu:10919/41203 |
| Date | 16 February 2010 |
| Creators | Braski, David N. |
| Contributors | Metallurgical Engineering, Houska, Charles R. |
| Publisher | Virginia Tech |
| Source Sets | Virginia Tech Theses and Dissertation |
| Detected Language | English |
| Type | Thesis, Text |
| Format | 54 pages, 1 unnumbered leaves, BTD, application/pdf, application/pdf |
| Rights | In Copyright, http://rightsstatements.org/vocab/InC/1.0/ |
| Relation | OCLC# 07104618, LD5655.V855_1965.B727.pdf |
Page generated in 0.0018 seconds