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Synchrotron X-ray Scanning Tunneling Microscopy Investigation of Interfacial Properties of Nanoscale Materials

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:ohiou1541197535168208
Date January 2018
CreatorsChang, Hao
PublisherOhio University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=ohiou1541197535168208
Rightsrestricted--full text unavailable until 2024-01-01, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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