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An in situ synchrotron X-ray diffraction study of stress-induced transformations in NiTi

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Identiferoai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:rtd-1990
Date01 April 2003
CreatorsRathod, Chandrasen
PublisherSTARS
Source SetsUniversity of Central Florida
LanguageEnglish
Detected LanguageEnglish
Typetext
SourceRetrospective Theses and Dissertations

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