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A study of the uses of scattered x-rays for internal standardization in x-ray spectroscopic analysis

Typescript. / Thesis (Ph. D.)--University of Hawaii, 1970. / Bibliography: leaves 183-192. / xiii, 192 l illus., graphs, tables

Identiferoai:union.ndltd.org:UHAWAII/oai:scholarspace.manoa.hawaii.edu:10125/11419
Date January 1970
CreatorsTaylor, David LeRoy
Publisher[Honolulu]
Source SetsUniversity of Hawaii at Manoa Libraries
Languageen-US
Detected LanguageEnglish
TypeThesis, Text
RightsAll UHM dissertations and theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission from the copyright owner.
RelationTheses for the degree of Doctor of Philosophy (University of Hawaii (Honolulu)) no. 344

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