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X-ray reflectivity study of GMR and porous silicon thin layers

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:8910jz04n
Date January 2007
CreatorsAsgharizadeh, Saeid
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationProquest: AAINR50768, Pid: 113864

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